Title :
High frequency passive microwave radiometry over a snow-covered surface in Alaska
Author :
Tait, Andrew ; Hall, Dorothy ; Foster, Jim ; Chang, Al
Author_Institution :
Univ. Space Res. Assoc., Greenbelt, MD, USA
Abstract :
Millimeter-wave Imaging Radiometer (MIR) data (ranging in frequency from 89 GHz to 325 GHz) collected from NASA ER-2 flights over Alaska in April 1995, are used to identify clouds, vegetation type, and snow cover. The procedure used is as follows: 1.) Determine whether a purely MIR-based cloud detection scheme is possible over a snow-covered surface; 2.) Analyze the influence of changing vegetation type on the brightness temperatures; and 3.) Compare completely snow-covered scenes with partially snow-covered and snow-free regions for cloudy and clear sky periods to determine whether varying snow conditions affect the MIR data. Results show that the determination of cloudy pixels over a snow-covered surface is not possible using a simple brightness temperature threshold technique. Furthermore, it is concluded that while no statistical discrimination between specific vegetation classes can be made, statistical significance is obtained when the vegetation is grouped into two classes only, for example vegetated and barren. It is also shown that the state of the snow cover (complete coverage; melting; or patchy) has a distinct affect on these results
Keywords :
atmospheric techniques; clouds; hydrological techniques; microwave imaging; radiometry; remote sensing; snow; 89 to 325 GHz; AD 1995 04; Alaska; MIR; MIR-based cloud detection; Millimeter-wave Imaging Radiometer; barren region; brightness temperatures; clouds; high frequency passive microwave radiometry; snow-covered surface; statistical significance; vegetation type; Brightness temperature; Clouds; Frequency; Microwave imaging; Microwave radiometry; Millimeter wave technology; NASA; Radiofrequency identification; Snow; Vegetation mapping;
Conference_Titel :
Geoscience and Remote Sensing Symposium Proceedings, 1998. IGARSS '98. 1998 IEEE International
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-4403-0
DOI :
10.1109/IGARSS.1998.691557