DocumentCode :
3256443
Title :
XML in Automatic Test System
Author :
Zhang, Yu ; Wang, Ai-hua ; Liang, Shu-Juan
Author_Institution :
Sch. of Inf. & Electron., Beijing Inst. of Technol., Beijing, China
Volume :
9
fYear :
2010
fDate :
16-18 Oct. 2010
Firstpage :
4489
Lastpage :
4492
Abstract :
This paper illustrates the XML characteristics and its good performance in data exchange, mainly introduces its application in Automatic Test System, including data saving and retrieving, data exchange with Matlab and Relational Database.
Keywords :
XML; automatic test software; data handling; electronic data interchange; relational databases; Matlab database; XML characteristics; automatic test system; data exchange; data retrieval; data saving; extensible markup language; relational database; Data processing; Instruments; Relational databases; Software; Syntactics; XML; ATS; RDB; XML; data exchange;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Image and Signal Processing (CISP), 2010 3rd International Congress on
Conference_Location :
Yantai
Print_ISBN :
978-1-4244-6513-2
Type :
conf
DOI :
10.1109/CISP.2010.5646773
Filename :
5646773
Link To Document :
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