DocumentCode :
3256534
Title :
Physics-based dynamic electro-thermal models of power bipolar devices (PiN diode and IGBT)
Author :
Igic, Petar M. ; Mawby, Phil A. ; Towers, Malcolm S.
Author_Institution :
Univ. of Wales Swansea, UK
fYear :
2001
fDate :
2001
Firstpage :
381
Lastpage :
384
Abstract :
New dynamic electro-thermal models of the power bipolar devices (PiN diode and IGBT) are presented in this paper. Firstly, electric device models were made developing a new 1D representation of the ambipolar diffusion equation which is packaged as a module that can be reused for all bipolar devices, subject to appropriate boundary conditions. Then electric models were transformed into the electro-thermal models by adding a thermal node. This thermal node stores information about junction temperature and it represents a connection between the device and the rest of the circuit thermal network. All models have been found to be efficient and robust in all cases examined
Keywords :
insulated gate bipolar transistors; p-i-n diodes; power semiconductor diodes; semiconductor device models; 1D ambipolar diffusion equation; IGBT; PiN diode; circuit thermal network; dynamic electro-thermal model; electric device model; junction temperature; power bipolar device; thermal node; Boundary conditions; Circuit simulation; Computational modeling; Equations; Insulated gate bipolar transistors; Power system modeling; Predictive models; Temperature dependence; Transient analysis; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Semiconductor Devices and ICs, 2001. ISPSD '01. Proceedings of the 13th International Symposium on
Conference_Location :
Osaka
ISSN :
1063-6854
Print_ISBN :
4-88686-056-7
Type :
conf
DOI :
10.1109/ISPSD.2001.934634
Filename :
934634
Link To Document :
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