• DocumentCode
    3256534
  • Title

    Physics-based dynamic electro-thermal models of power bipolar devices (PiN diode and IGBT)

  • Author

    Igic, Petar M. ; Mawby, Phil A. ; Towers, Malcolm S.

  • Author_Institution
    Univ. of Wales Swansea, UK
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    381
  • Lastpage
    384
  • Abstract
    New dynamic electro-thermal models of the power bipolar devices (PiN diode and IGBT) are presented in this paper. Firstly, electric device models were made developing a new 1D representation of the ambipolar diffusion equation which is packaged as a module that can be reused for all bipolar devices, subject to appropriate boundary conditions. Then electric models were transformed into the electro-thermal models by adding a thermal node. This thermal node stores information about junction temperature and it represents a connection between the device and the rest of the circuit thermal network. All models have been found to be efficient and robust in all cases examined
  • Keywords
    insulated gate bipolar transistors; p-i-n diodes; power semiconductor diodes; semiconductor device models; 1D ambipolar diffusion equation; IGBT; PiN diode; circuit thermal network; dynamic electro-thermal model; electric device model; junction temperature; power bipolar device; thermal node; Boundary conditions; Circuit simulation; Computational modeling; Equations; Insulated gate bipolar transistors; Power system modeling; Predictive models; Temperature dependence; Transient analysis; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices and ICs, 2001. ISPSD '01. Proceedings of the 13th International Symposium on
  • Conference_Location
    Osaka
  • ISSN
    1063-6854
  • Print_ISBN
    4-88686-056-7
  • Type

    conf

  • DOI
    10.1109/ISPSD.2001.934634
  • Filename
    934634