DocumentCode
3256534
Title
Physics-based dynamic electro-thermal models of power bipolar devices (PiN diode and IGBT)
Author
Igic, Petar M. ; Mawby, Phil A. ; Towers, Malcolm S.
Author_Institution
Univ. of Wales Swansea, UK
fYear
2001
fDate
2001
Firstpage
381
Lastpage
384
Abstract
New dynamic electro-thermal models of the power bipolar devices (PiN diode and IGBT) are presented in this paper. Firstly, electric device models were made developing a new 1D representation of the ambipolar diffusion equation which is packaged as a module that can be reused for all bipolar devices, subject to appropriate boundary conditions. Then electric models were transformed into the electro-thermal models by adding a thermal node. This thermal node stores information about junction temperature and it represents a connection between the device and the rest of the circuit thermal network. All models have been found to be efficient and robust in all cases examined
Keywords
insulated gate bipolar transistors; p-i-n diodes; power semiconductor diodes; semiconductor device models; 1D ambipolar diffusion equation; IGBT; PiN diode; circuit thermal network; dynamic electro-thermal model; electric device model; junction temperature; power bipolar device; thermal node; Boundary conditions; Circuit simulation; Computational modeling; Equations; Insulated gate bipolar transistors; Power system modeling; Predictive models; Temperature dependence; Transient analysis; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Semiconductor Devices and ICs, 2001. ISPSD '01. Proceedings of the 13th International Symposium on
Conference_Location
Osaka
ISSN
1063-6854
Print_ISBN
4-88686-056-7
Type
conf
DOI
10.1109/ISPSD.2001.934634
Filename
934634
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