Efficient stimuli generators for detection of path delay faults

Author

Gjermundnes, Oystein ; Aas, Einar J.

Author_Institution

Dept. of Electron. & Telecommun., NTNU, Trondheim

fYear

2005

fDate

7-10 Aug. 2005

Firstpage

1709

Abstract

This paper presents a way to construct accumulator based test vector generators intended for efficient detection of path delay faults. Experiments conducted using our path delay fault simulator, GFault, shows that our proposed generator can give as much as 30times reduction in test time for circuits in the ISCAS85 benchmark suite compared to an accumulator based pseudo random generator

Keywords

benchmark testing; delays; fault simulation; random number generation; ISCAS85 benchmark suite; accumulator based pseudo random generator; accumulator based test vector generators; path delay fault detection; path delay fault simulator; stimuli generators; Circuit faults; Circuit simulation; Circuit testing; Delay; Electrical fault detection; Electronic equipment testing; Fault detection; Hardware; Robustness; Test pattern generators;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems, 2005. 48th Midwest Symposium on

Conference_Location

Covington, KY

Print_ISBN

0-7803-9197-7

Type

conf

DOI

10.1109/MWSCAS.2005.1594449

Filename

1594449

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3256843