DocumentCode
3257022
Title
A Novel Flash Fast-Locking Digital PLL: Verilog-AMS Modeling and Simulations
Author
Wagdy, Mahmoud Fawzy ; Jayaram, Sandesh Maraliga
Author_Institution
California State Univ., Long Beach (CSULB), Long Beach, CA, USA
fYear
2013
fDate
15-17 April 2013
Firstpage
217
Lastpage
222
Abstract
A novel flash fast-locking digital phase-locked loop (DPLL) is presented and behaviorally modeled using Verilog-AMS. The DPLL operation includes two stages: (1) a novel coarse-tuning stage for frequency tracking which employs a flash algorithm leading to a thermometer code as done in flash A/D converters (ADCs) and (2) a fine-tuning stage similar to conventional (classical) DPLLs. The coarse-tuning stage includes an array of frequency comparators, a priority encoder, a digital-to-analog converter (DAC), and control logic including a monostable multivibrator. Verilog-AMS (Smash) is used to design and simulate both the fast-locking DPLL and its classical counterpart. Simulations revealed a lock time improvement (reduction) by a factor of 1.50-3.00 depending on the size of the input frequency hop in favor of the fast-locking DPLL.
Keywords
analogue-digital conversion; digital phase locked loops; hardware description languages; ADC; DAC; Smash; Verilog-AMS; control logic; digital phase-locked loop; digital-to-analog converter; fine-tuning stage; flash A-D converters; flash algorithm; frequency comparators; frequency tracking; lock time improvement; monostable multivibrator; novel coarse-tuning stage; novel flash fast-locking DPLL; priority encoder; thermometer code; Arrays; Frequency modulation; Hardware design languages; Phase frequency detector; Time-frequency analysis; Tuning; Voltage-controlled oscillators; DPLL; PLL; Verilog-AMS; behavioral modeling; coarse tuning; fast-locking; fine tuning; flash algorithm; frequency hop; frequency tracking; lock time; phase tracking; thermometer code;
fLanguage
English
Publisher
ieee
Conference_Titel
Information Technology: New Generations (ITNG), 2013 Tenth International Conference on
Conference_Location
Las Vegas, NV
Print_ISBN
978-0-7695-4967-5
Type
conf
DOI
10.1109/ITNG.2013.36
Filename
6614313
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