Title :
Statistic Analysis for Probabilistic Processes
Author :
de Rougemont, M. ; Tracol, Mathieu
Author_Institution :
LRI-CNRS, Univ. Paris-South, Orsay, France
Abstract :
We associate a statistical vector to a trace and a geometrical embedding to a Markov decision process, based on a distance on words, and study basic membership and equivalence problems. The membership problem for a trace w and a Markov decision process S decides if there exists a strategy on S which generates with high probability traces close to w. We prove that membership of a trace is testable and equivalence of MDPs is polynomial time approximable. For probabilistic automata, membership is not testable, and approximate equivalence is undecidable. We give a class of properties, based on results concerning the structure of the tail sigma-field of a finite Markov chain, which characterizes equivalent Markov decision processes in this context.
Keywords :
Markov processes; bisimulation equivalence; computational complexity; decidability; decision theory; probabilistic automata; statistical analysis; Markov decision process; equivalence problem; finite Markov chain; geometrical embedding; membership problem; polynomial time approximable; probabilistic automata; probabilistic trace; property testing; statistic analysis; statistical vector; tail sigma-field; undecidability; Automata; Automatic testing; Computer science; Frequency; Higher order statistics; Polynomials; Probabilistic logic; Statistical analysis; System testing; Tail; Approximation; Markov Decision Processes; Probabilistic Automata; Property Testing; State Action frequency; tail sigma field;
Conference_Titel :
Logic In Computer Science, 2009. LICS '09. 24th Annual IEEE Symposium on
Conference_Location :
Los Angeles, CA
Print_ISBN :
978-0-7695-3746-7
DOI :
10.1109/LICS.2009.36