Title :
Statistical modeling of over-range protection requirement for a switched capacitor inter-stage gain amplifier
Author :
Katyal, Vipul ; Lin, Yu ; Geiger, Randall L. ; Chen, Degang J.
Author_Institution :
Dept. of Electr. & Comput. Eng., Iowa State Univ., Ames, IA
Abstract :
Over-range protection requirements for switched capacitor inter-stage amplifiers in pipelined analog to digital converters are investigated. Two popular inter-stage amplifier architectures, charge-redistribution and flip-around, are considered. Closed form expressions for the three sigma variation of the output trip point voltage levels of the amplifier transfer curve are given for both architectures. These expressions can be used for to determine the level of over-range protection required and to assist in allocation of error budgets to different pipeline blocks
Keywords :
DC amplifiers; amplification; analogue-digital conversion; digital-analogue conversion; statistical analysis; switched capacitor networks; amplifier transfer curve; charge-redistribution interstage amplifier architecture; closed form expressions; flip-around interstage amplifier architecture; output trip point voltage levels; over-range protection requirement; pipelined analog-to-digital converters; sigma variation; statistical modeling; switched capacitor interstage gain amplifier; Analog-digital conversion; Capacitors; Chromium; Circuits; Computer architecture; Degradation; Electronics industry; Pipelines; Protection; Voltage;
Conference_Titel :
Circuits and Systems, 2005. 48th Midwest Symposium on
Conference_Location :
Covington, KY
Print_ISBN :
0-7803-9197-7
DOI :
10.1109/MWSCAS.2005.1594476
