DocumentCode
3257424
Title
Trapping centers engineering by including of nanoparticles into organic semiconductors
Author
Weis, Martin ; Manaka, Takaaki ; Iwamoto, Mitsumasa
Author_Institution
Dept. of Phys. Electron., Tokyo Inst. of Technol., Tokyo
fYear
2008
fDate
7-11 Sept. 2008
Firstpage
338
Lastpage
341
Abstract
This contribution reports the fabrication of pentacene organic field-effect transistor (OFET) with designed space-charge. By including a single layer of silicon nanoparticles as trapping centers, it was possible to create a space-charge field with strong influence on carrier injection and transport. It was found that NPs work as trapping centers of charge carriers. We demonstrate that nanoparticles film can serves for design of accumulated charge in OFET and thus change of charge injection time and transport properties. This behaviour is fully supported by theoretical analysis of the Maxwell-Wagner model. This gives us powerful tool for voltage control of carrier injection time by applied voltage and by setup of nanoparticle density is a possible design electric property.
Keywords
elemental semiconductors; nanoparticles; organic field effect transistors; silicon; space charge; Maxwell-Wagner model; carrier injection; carrier transport; organic semiconductors; pentacene organic field-effect transistor fabrication; silicon nanoparticles; space-charge; trapping centers; voltage control; Electrodes; Electron traps; Insulation; Nanoparticles; OFETs; Organic semiconductors; Pentacene; Semiconductor materials; Silicon; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulating Materials, 2008. (ISEIM 2008). International Symposium on
Conference_Location
Mie
Print_ISBN
978-4-88686-005-7
Electronic_ISBN
978-4-88686-006-4
Type
conf
DOI
10.1109/ISEIM.2008.4664449
Filename
4664449
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