• DocumentCode
    3257424
  • Title

    Trapping centers engineering by including of nanoparticles into organic semiconductors

  • Author

    Weis, Martin ; Manaka, Takaaki ; Iwamoto, Mitsumasa

  • Author_Institution
    Dept. of Phys. Electron., Tokyo Inst. of Technol., Tokyo
  • fYear
    2008
  • fDate
    7-11 Sept. 2008
  • Firstpage
    338
  • Lastpage
    341
  • Abstract
    This contribution reports the fabrication of pentacene organic field-effect transistor (OFET) with designed space-charge. By including a single layer of silicon nanoparticles as trapping centers, it was possible to create a space-charge field with strong influence on carrier injection and transport. It was found that NPs work as trapping centers of charge carriers. We demonstrate that nanoparticles film can serves for design of accumulated charge in OFET and thus change of charge injection time and transport properties. This behaviour is fully supported by theoretical analysis of the Maxwell-Wagner model. This gives us powerful tool for voltage control of carrier injection time by applied voltage and by setup of nanoparticle density is a possible design electric property.
  • Keywords
    elemental semiconductors; nanoparticles; organic field effect transistors; silicon; space charge; Maxwell-Wagner model; carrier injection; carrier transport; organic semiconductors; pentacene organic field-effect transistor fabrication; silicon nanoparticles; space-charge; trapping centers; voltage control; Electrodes; Electron traps; Insulation; Nanoparticles; OFETs; Organic semiconductors; Pentacene; Semiconductor materials; Silicon; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulating Materials, 2008. (ISEIM 2008). International Symposium on
  • Conference_Location
    Mie
  • Print_ISBN
    978-4-88686-005-7
  • Electronic_ISBN
    978-4-88686-006-4
  • Type

    conf

  • DOI
    10.1109/ISEIM.2008.4664449
  • Filename
    4664449