DocumentCode :
3257461
Title :
Exact evaluation of diagnostic test resolution
Author :
Kubiak, Ken ; Parkes, Steven ; Fuchs, W. Kent ; Saleh, Resve
Author_Institution :
Coord. Sci. Lab., Illinois Univ., Urbana, IL, USA
fYear :
1992
fDate :
8-12 Jun 1992
Firstpage :
347
Lastpage :
352
Abstract :
The authors introduce a new measure of the diagnostic resolution of a test set: the sizes of all equivalence classes in the circuit under the test set. This measure is a better indicator of the diagnostic capabilities of a test set than single-value metrics based on undistinguished pairs of faults or completely distinguished faults. A symbolic algorithm for computing equivalence class sizes has been used to evaluate the diagnostic resolution of deterministic single-stuck-at fault test sets for ISCAS combinational and sequential benchmark circuits
Keywords :
combinatorial circuits; fault location; logic testing; sequential circuits; ISCAS combinational; deterministic single-stuck-at fault test sets; diagnostic capabilities; diagnostic test resolution; equivalence classes; exact evaluation; sequential benchmark circuits; single-value metrics; symbolic algorithm; Benchmark testing; Binary decision diagrams; Boolean functions; Circuit faults; Circuit testing; Coordinate measuring machines; Fault diagnosis; Fault location; Size measurement; Test pattern generators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 1992. Proceedings., 29th ACM/IEEE
Conference_Location :
Anaheim, CA
ISSN :
0738-100X
Print_ISBN :
0-8186-2822-7
Type :
conf
DOI :
10.1109/DAC.1992.227780
Filename :
227780
Link To Document :
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