Title :
HOPE: an efficient parallel fault simulator
Author :
Lee, Hyung Ki ; Ha, Dong Sam
Author_Institution :
Bradley Dept. of Electr. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
Abstract :
The authors present an efficient sequential circuit parallel fault simulator, HOPE, which simulates 32 faults at a time. HOPE is a parallel fault simulator based on single fault propagation. It adopts the zero gate delay model. The key idea incorporated in HOPE is to screen out faults with short propagation paths, and prevent them from being simulated in parallel. The screening process drastically reduces the number of faults simulated in parallel to achieve substantial speedup. The experimental results presented show that HOPE is about two times faster than PROOFS for most ISCAS89 sequential benchmark circuits
Keywords :
delays; fault location; logic testing; sequential circuits; HOPE; PROOFS; parallel fault simulator; screening process; sequential circuit; single fault propagation; zero gate delay model; Automation; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Delay; Fault diagnosis; Gold; Logic; Sequential circuits;
Conference_Titel :
Design Automation Conference, 1992. Proceedings., 29th ACM/IEEE
Conference_Location :
Anaheim, CA
Print_ISBN :
0-8186-2822-7
DOI :
10.1109/DAC.1992.227782