Title :
Characterizing cable flexure effects in S-parameter measurements
Author :
Mubarak, Faisal ; Rietveld, Gert ; Hoogenboom, Dennis ; Spirito, M.
Author_Institution :
Van Swinden Lab. (YSL), Delft, Netherlands
Abstract :
With the increasing demand for lower uncertainties S-parameter measurements, the accurate evaluation of the effects contributing to the noise and uncertainty of these measurements becomes equally more important. A thorough evaluation of one of these effects is presented in this contribution, namely cable flexure. Monte Carlo simulations are presented to resolve the correlation between different parameters and cable flexure conditions in S-parameter measurements. A subsequent systematic experimental study of different cables quantifies the noise and systematic errors in S-parameter measurements caused by their flexure. The results of the study show that a factor 2 can be gained in uncertainty of e.g. transmission measurements by optimal cable movement and de-embedding of the residual systematic effects.
Keywords :
Monte Carlo methods; S-parameters; bending; cable testing; coaxial cables; measurement errors; network analysers; Monte Carlo simulations; S-parameter measurements; cable flexure conditions; optimal cable movement; residual systematic effects; systematic errors; transmission measurements; Calibration; Coaxial cables; Measurement uncertainty; Monte Carlo methods; Noise; Scattering parameters; Vectors; PNA; S-parameters; VNA; cable effects; cable flexure; de-embedding; impedance; measurement; measurement techniques;
Conference_Titel :
Microwave Measurement Conference, 2013 82nd ARFTG
Conference_Location :
Columbus, OH
DOI :
10.1109/ARFTG-2.2013.6737336