Title :
Three-harmonic time-domain load-pull measurement system with the 40-GHz maximum third order harmonic frequency for nonlinear device characterization
Author :
Wooyeol Choi ; Nelson, Scott ; Ferwalt, Darren ; Mongia, Rajesh ; Shichijo, H. ; Kenneth, K.O.
Author_Institution :
Univ. of Texas at Dallas, Richardson, TX, USA
Abstract :
A three-harmonic time-domain load-pull measurement system, which operates up to 40 GHz for the highest harmonic, is demonstrated. The system uses a 50-GHz nonlinear vector network analyzer. The load generator is comprised of three synchronized signal generators and a harmonic combining network using cascaded broadband diplexers, as well as an optional mechanical tuner. Load-pull measurements are validated up to 16-GHz fundamental frequency by comparing the source impedance measured using a network analyzer and the Γopt measured using the load-pull measurement system. Measurements of a 0.25-μm GaN HEMT at 6-GHz fundamental frequency and a 0.5-μm InP HBT at 10-GHz fundamental frequency suggest that the power efficiency of amplifiers using the devices can be improved by 3-6% using the measurement results.
Keywords :
III-V semiconductors; gallium compounds; heterojunction bipolar transistors; high electron mobility transistors; indium compounds; microwave measurement; microwave transistors; multiplexing equipment; network analysers; nonlinear network analysis; power amplifiers; semiconductor device measurement; signal generators; wide band gap semiconductors; GaN; HBT; HEMT; InP; cascaded broadband diplexers; frequency 10 GHz; frequency 16 GHz; frequency 40 GHz; frequency 50 GHz; frequency 6 GHz; harmonic combining network; load generator; mechanical tuner; nonlinear device characterization; nonlinear vector network analyzer; power amplifiers; power efficiency; signal generators; size 0.25 mum; size 0.5 mum; third order harmonic frequency; three-harmonic time-domain load-pull measurement system; Calibration; Frequency measurement; Generators; Harmonic analysis; Power measurement; Power system harmonics; Semiconductor device measurement; load-pull measurement; nonlinear network analysis; power amplifier;
Conference_Titel :
Microwave Measurement Conference, 2013 82nd ARFTG
Conference_Location :
Columbus, OH
DOI :
10.1109/ARFTG-2.2013.6737344