DocumentCode :
3258001
Title :
Measurement system transient and power questions in mm-wave high resolution pulsed S-parameter measurements
Author :
Martens, J.
Author_Institution :
Anritsu, Morgan Hill, CA, USA
fYear :
2013
fDate :
18-21 Nov. 2013
Firstpage :
1
Lastpage :
5
Abstract :
Mm-wave pulse profile measurements can present challenges in part due to high multiplication factors sometimes needed, the position of stimulus modulation (often part way in a multiplier chain), video poles present in some of the elements and generally more difficult linearity questions. These issues have been explored in the 80-500 GHz range and the behavior between modulation and final multiplication was the most dynamic introducing both easily correctable distortions and single-shot effects that are more challenging to process. Resolution, down to the scale of a few ns, did not seem to be affected when reasonable alignment and isothermal procedures were followed. The stimulus power effects also seemed to be minimal when coupled with sufficiently linear receivers. Example calibrations and measurements have been performed for ~20 dBm W-band and D-band systems and lower power WR-2.2 systems.
Keywords :
S-parameters; distortion; measurement systems; millimetre wave measurement; millimetre wave receivers; D-band system; W-band system; WR-2.2 system; alignment; distortion; frequency 80 GHz to 500 GHz; isothermal procedure; linear receiver; measurement system transient; mm wave high resolution pulsed S-parameter measurement; mm wave pulse profile measurement; single shot effect; stimulus modulation; stimulus power effects; video poles; Bandwidth; Calibration; Frequency measurement; Frequency modulation; Power measurement; Pulse measurements; high power; mm-wave calibration; pulsed; s-parameters;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Measurement Conference, 2013 82nd ARFTG
Conference_Location :
Columbus, OH
Type :
conf
DOI :
10.1109/ARFTG-2.2013.6737347
Filename :
6737347
Link To Document :
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