DocumentCode :
3258072
Title :
Off - State Performances of Ideal Schottky Barrier Diodes (SBD) on Diamond and Silicon Carbide
Author :
Brezeanu, G. ; Visoreanu, A. ; Brezeanu, M. ; Udrea, F. ; Amaratunga, G.A.J. ; Enache, I. ; Rusu, I. ; Draghici, F.
Author_Institution :
Politehnica Univ. of Bucharest
Volume :
2
fYear :
2006
fDate :
27-29 Sept. 2006
Firstpage :
319
Lastpage :
322
Abstract :
Extensive numerical simulations have been carried out to compare the electrical performance of ideal Schottky diodes on diamond and silicon carbide. The influences of the drift layer parameters on the off-state behaviour of the diodes are presented for both punch-through (PT) and non punch-through (nPT) structures. In PT case breakdown voltage was shown to be constant with the drift doping at low concentrations. Analytical expressions of the breakdown voltage variation with doping for nPT diodes are also included
Keywords :
Schottky diodes; diamond; power semiconductor devices; semiconductor device breakdown; silicon compounds; wide band gap semiconductors; Schottky barrier diodes; SiC; breakdown voltage variation; diamond; drift doping; drift layer parameters; electrical performance; non punch-through structures; off-state behaviour; punch-through structure; silicon carbide; Doping; Electric breakdown; Schottky barriers; Schottky diodes; Semiconductor diodes; Silicon carbide; Temperature dependence; Temperature sensors; Thermal conductivity; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
International Semiconductor Conference, 2006
Conference_Location :
Sinaia
Print_ISBN :
1-4244-0109-7
Type :
conf
DOI :
10.1109/SMICND.2006.284008
Filename :
4063236
Link To Document :
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