DocumentCode
3258144
Title
Improvement on component stresses of single-stage electronic ballasts
Author
Wu, T.-F. ; Lee, C.-Y. ; Wu, Y.-J. ; Su, J.-Y.
Author_Institution
Dept. of Electr. Eng., Nat. Chung Cheng Univ., Chia-Yi, Taiwan
Volume
1
fYear
1999
fDate
1999
Firstpage
285
Abstract
This paper presents an improvement on component stresses of single-stage electronic ballasts derived with synchronous switch technique (SST). Based on the SST, the derivation of a single-stage inverter (SSI) used for realizing the ballasts is then addressed. The SSI can achieve both high power factor and ballasting function. During lamp start-up transition, power imbalance may exist between the power factor correction semi-stage and the ballast semi-stage. This imbalance usually results in a high DC-link voltage which, in turn, impairs the switching devices. Investigation of component stresses due to this imbalance from start-up transition through steady state operation is conducted. Control strategies for reducing component stresses and hot resistance detection circuits for minimizing electrode sputtering are therefore proposed. Hardware measurements are presented to verify the theoretical discussions
Keywords
DC-DC power convertors; bridge circuits; invertors; lamp accessories; power factor correction; switching circuits; ballast semi-stage; buck-boost converter; component stresses; electrode sputtering minimisation; half-bridge inverter; high DC-link voltage; high power factor; hot resistance detection circuits; lamp start-up transition; power factor correction semi-stage; power imbalance; series-resonant parallel loaded inverter; single-stage electronic ballasts; single-stage inverter; steady state operation; switching devices; synchronous switch technique; Circuits; Electronic ballasts; Inverters; Lamps; Power factor correction; Reactive power; Steady-state; Stress control; Switches; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Industry Applications Conference, 1999. Thirty-Fourth IAS Annual Meeting. Conference Record of the 1999 IEEE
Conference_Location
Phoenix, AZ
ISSN
0197-2618
Print_ISBN
0-7803-5589-X
Type
conf
DOI
10.1109/IAS.1999.799969
Filename
799969
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