DocumentCode
3258259
Title
Automatic neighborhood selection for SAR models applied to gray texture
Author
Sutaone, Mukul ; Kakade, Suhas ; Bartakke, Prashant
Author_Institution
Electron. & Telecomm Dept., Coll. of Eng. Pune, Pune, India
fYear
2009
fDate
23-26 Jan. 2009
Firstpage
1
Lastpage
5
Abstract
Textures can be broadly divided into two categories, namely, stochastic and deterministic. The stochastic textures are characterized by its statistical properties and do not have easily identifiable primitives. Even if one can extract such primitives, a placement rule description for such textures may be extremely complicated. One of the ways to describe and generate such textures is simultaneous autoregressive (SAR) linear prediction models. The major difficulty in utilizing this model is choosing proper neighborhood locations, within which pixels are considered interdependent. The work presented here emphasizes the automatic neighbor location selection based on sample correlation function. The algorithm is stretched to the possible extent with rigorous experimentation that proves the decorrelation phenomenon with residual image. Two new methods viz. `actual residual image´ and `uniform noise transformed to a noise with histogram matched to residual image´ are suggested to synthesize texture towards perceptual quality improvement.
Keywords
autoregressive processes; image matching; image texture; statistical analysis; SAR models; automatic neighbor location selection; decorrelation phenomenon; gray texture; histogram image matching; placement rule description; residual image; simultaneous autoregressive linear prediction models; statistical properties; stochastic textures; Decorrelation; Educational institutions; Histograms; Least squares approximation; Maximum likelihood estimation; Parameter estimation; Pixel; Stochastic processes; Telecommunications; Yield estimation; Neighborhood; SAR model; Sample Correlation Function (SCF); Stochastic Textures;
fLanguage
English
Publisher
ieee
Conference_Titel
TENCON 2009 - 2009 IEEE Region 10 Conference
Conference_Location
Singapore
Print_ISBN
978-1-4244-4546-2
Electronic_ISBN
978-1-4244-4547-9
Type
conf
DOI
10.1109/TENCON.2009.5396152
Filename
5396152
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