DocumentCode
3258269
Title
Thru-Short-Delay (TSD) calibration technique for one-port measurements
Author
Jeong-Hwan Kim ; Jin-Seob Kang ; Jeong-Il Park ; Dae-Chan Kim
Author_Institution
Center for Electromagn. Wave, Korea Res. Inst. of Stand. & Sci. (KRISS), Daejeon, South Korea
fYear
2013
fDate
18-21 Nov. 2013
Firstpage
1
Lastpage
4
Abstract
This paper presents a method of vector network analyzer calibration using `Thru-Short-Delay´ for one-port measurements, which is expected to give a comparable accuracy to the TRL technique as it does not accompany cable movements. It uses a one-port VNA (Vector Network Analyzer) to avoid cable movements with `OSL´ (Open-Short-Load) calibration standards, which are widely used for one-port measurements, together with an air line, preferably one giving a 90-degree phase shift.
Keywords
calibration; measurement standards; network analysers; one-port measurements; open-short-load calibration standards; thru-short-delay calibration; vector network analyzer calibration; Accuracy; Calibration; Frequency measurement; Mathematical model; Measurement uncertainty; Reflection coefficient; Standards; Calibration techniques; VNA; air lines; error box; one-port measurements; residual errors;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Measurement Conference, 2013 82nd ARFTG
Conference_Location
Columbus, OH
Type
conf
DOI
10.1109/ARFTG-2.2013.6737362
Filename
6737362
Link To Document