DocumentCode :
3258509
Title :
Influence of temperature variation on characteristics of ZnO elements
Author :
Miyakawa, Y. ; Sakoda, T. ; Otsubo, M. ; Ikuta, M.
Author_Institution :
Dept. of Electr. & Electron. Eng., Univ. of Miyazaki, Miyazaki
fYear :
2008
fDate :
7-11 Sept. 2008
Firstpage :
119
Lastpage :
122
Abstract :
Zinc oxide (ZnO) surge arresters with series gap are equipped to protect the electricity failure for power distribution systems. Although the ZnO surge arresters might have enough performances to protect the electricity failure when they were installed, the performance may decrease with the increase of the number of operation times and the time elapsed after the installation. The aim of this study is to investigate the effects of temperature variation on characteristics of ZnO elements. We first heated ZnO elements up to temperatures of 350 K, 400 K, 450 K, and 500 K, and then characteristics of V-t and 50% flashover voltage were examined. Next, in order to obtain V-I characteristic, the impulse current with 4/10 mus-8kA was applied at each temperature. Finally, V-t characteristic and 50% flashover voltage for each temperature were evaluated, again. The results showed that temperature had an influence on V-I characteristics of ZnO surge arrester. Finally, V-t characteristics and 50% flashover voltages for each temperature were evaluated, again. The results showed that temperature had an influence on V-I characteristics of ZnO surge arrester.
Keywords :
II-VI semiconductors; arresters; flashover; power semiconductor devices; zinc compounds; V-I characteristics; ZnO; flashover voltage; impulse current; surge arrester; temperature 350 K; temperature 400 K; temperature 450 K; temperature 500 K; temperature variation; zinc oxide elements; Arresters; Circuits; Electrodes; Flashover; Lightning; Power system protection; Surge protection; Temperature; Voltage; Zinc oxide;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulating Materials, 2008. (ISEIM 2008). International Symposium on
Conference_Location :
Mie
Print_ISBN :
978-4-88686-005-7
Electronic_ISBN :
978-4-88686-006-4
Type :
conf
DOI :
10.1109/ISEIM.2008.4664511
Filename :
4664511
Link To Document :
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