DocumentCode
3258571
Title
Phony Stability Problem in Fast LDOs
Author
Stanescu, Cornel
Author_Institution
Catalyst Semicond. Romania S.R.L., Bucharest
Volume
2
fYear
2006
fDate
27-29 Sept. 2006
Firstpage
413
Lastpage
416
Abstract
The paper presents a phenomenon associated with the evaluation of fast LDOs. Initial measurements seemed to indicate a potential low phase-margin, which was entirely different from the PSPICE simulations. In fact, it was a phony stability problem given by the response of an input parasitic RLC circuit to the fast-pulsed current load; response that was transmitted to the output through a lower PSRR at high frequency
Keywords
RLC circuits; SPICE; circuit stability; LDOS; PSPICE simulations; RLC circuit; phony stability problem; Capacitors; Circuit simulation; Circuit stability; DC generators; Feedback circuits; Phase measurement; Pulse circuits; Pulse generation; RLC circuits; SPICE;
fLanguage
English
Publisher
ieee
Conference_Titel
International Semiconductor Conference, 2006
Conference_Location
Sinaia
Print_ISBN
1-4244-0109-7
Type
conf
DOI
10.1109/SMICND.2006.284033
Filename
4063261
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