• DocumentCode
    3258676
  • Title

    Surface defect detection of metal parts: Use of multimodal illuminations and hyperspectral imaging algorithms

  • Author

    Benmoussat, Mohammed ; Spinnler, Klaus ; Guillaume, Mireille

  • Author_Institution
    Fraunhofer IIS, Erlangen, Germany
  • fYear
    2012
  • fDate
    16-17 July 2012
  • Firstpage
    228
  • Lastpage
    233
  • Abstract
    The illumination technique used in the industrial inspection systems can affect the quality of the acquired images. The choice of this technique plays an important role in the designing process of the system. Using multiple modalities can then avoid a difficult choice and increase the performances. We propose to consider multi-modal data by constructing pseudo-spectral cubes and by using hyperspectral imagery algorithms to detect 3D surface defects on metal parts. In this paper, four basic lighting modalities (white source light and monochromatic source light including non-polarized and polarized light) are proposed and tested to illuminate the metal parts, and different detection algorithms have been compared. We show that the spectral angle mapper is able to detect the defects with a non-supervised approach, and gives good detection performances.
  • Keywords
    automatic optical inspection; lighting; mechanical engineering computing; metal products; object detection; 3D surface defect detection; acquired image quality; designing process; hyperspectral imagery algorithms; hyperspectral imaging algorithm; industrial inspection systems; lighting modalities; metal parts; monochromatic source light; multimodal data; multimodal illumination technique; nonpolarized light; nonsupervised approach; polarized light; pseudospectral cube; spectral angle mapper; white source light; Cameras; Hyperspectral imaging; Image color analysis; Light emitting diodes; Lighting; Metals; Sensors; Hyperspectral imaging; Inspection; Lighting; Object detection;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Imaging Systems and Techniques (IST), 2012 IEEE International Conference on
  • Conference_Location
    Manchester
  • Print_ISBN
    978-1-4577-1776-5
  • Type

    conf

  • DOI
    10.1109/IST.2012.6295527
  • Filename
    6295527