Title :
Simulating lossy interconnect with high frequency nonidealities in linear time
Author :
Roychowdhury, Jaijeet S. ; Newton, A. Richard ; Pederson, Donald O.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
Abstract :
A linear time simulation technique is described in which each impulse response of frequency-varying lines is decomposed into two terms, with widely separated rates of decay. One term corresponds to a simple lossy line while the other represents the contribution of the high frequency nonideality. The latter term can decay to insignificant levels in an interval much shorter than simulation times of interest, making truncation possible and leading to computation in linear time. The former term usually decays over much longer intervals, so truncation is not generally feasible. However, this term is also computed in linear time by a recursive procedure that involves no approximation of impulse responses. Experimental results verified the linear complexity of the new technique and demonstrated the computational advantage for simulations of five or more cycles, with speedups of more than 10 times for long simulations
Keywords :
circuit analysis computing; losses; nonlinear network analysis; transient response; transmission lines; frequency-varying lines; high frequency nonidealities; impulse response; linear complexity; linear time; linear time simulation; lossy interconnect; simple lossy line; Circuit simulation; Computational modeling; Computer simulation; Convolution; Distributed parameter circuits; Frequency; High performance computing; Integrated circuit interconnections; Power system transients; Skin effect;
Conference_Titel :
Design Automation Conference, 1992. Proceedings., 29th ACM/IEEE
Conference_Location :
Anaheim, CA
Print_ISBN :
0-8186-2822-7
DOI :
10.1109/DAC.1992.227858