• DocumentCode
    3258860
  • Title

    The unscented transform: a powerful tool for measurement uncertainty evaluation

  • Author

    Angrisani, Leopoldo ; Apuzzo, Massimo D. ; Moriello, Rosario Schiano Lo

  • Author_Institution
    Dipt. di Informatica e Sistemistica, Universita di Napoli Federico II
  • fYear
    2005
  • fDate
    13-13 May 2005
  • Firstpage
    27
  • Lastpage
    32
  • Abstract
    An original approach for uncertainty evaluation in indirect measurements is presented here in after. The approach applies the unscented transform to the measurement model (i.e. the functional relationship between the output and input quantities) in order to estimate the output expectation along with the associated standard uncertainty. Thanks to some nice properties of the unscented transform, notable limits of the current GUM recommendations are overcome. In particular, reliable estimates are granted also in the presence of nonlinear and/or non-analytical measurement models, or complex digital signal-processing algorithms. A number of numerical tests are conducted on simulated and actual measurement data. Remarkable concurrence between the obtained estimates and those granted by Monte Carlo simulations confirms the reliability and efficacy of the proposed approach
  • Keywords
    Monte Carlo methods; measurement uncertainty; reliability; transforms; GUM recommendations; Monte Carlo simulations; associated standard uncertainty; complex digital signal-processing algorithms; indirect measurements; measurement model; measurement uncertainty evaluation; nonanalytical measurement models; nonlinear measurement models; reliability; unscented transform; Algebra; Availability; Density measurement; Dispersion; Measurement standards; Measurement uncertainty; Particle measurements; Probability density function; Taylor series; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Methods for Uncertainty Estimation in Measurement, 2005. Proceedings of the 2005 IEEE International Workshop on
  • Conference_Location
    Niagara Falls, Ont.
  • Print_ISBN
    0-7803-8979-4
  • Type

    conf

  • DOI
    10.1109/AMUEM.2005.1594599
  • Filename
    1594599