DocumentCode
3258973
Title
Maximum current estimation in CMOS circuits
Author
Kriplani, Harish ; Najm, Farid ; Hajj, Ibrahim
Author_Institution
Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
fYear
1992
fDate
8-12 Jun 1992
Firstpage
2
Lastpage
7
Abstract
The authors propose pattern-independent, linear-time algorithms that provide tight upper bounds on maximum envelope current (MEC) waveforms. The proposed approach represents a trade-off between execution speed and tightness of these bounds. The MEC waveform is a point-wise maximum on all the possible waveforms that the circuit can draw. Experimental results on several benchmark circuits are provided to establish the usefulness of this approach
Keywords
CMOS integrated circuits; VLSI; circuit analysis computing; integrated circuit testing; CMOS circuits; VLSI; benchmark circuits; linear-time algorithms; maximum current estimation; maximum envelope current; point-wise maximum; tight upper bounds; Circuits; Current supplies; Degradation; Design engineering; Laboratories; Power engineering and energy; Power engineering computing; Power supplies; Process design; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 1992. Proceedings., 29th ACM/IEEE
Conference_Location
Anaheim, CA
ISSN
0738-100X
Print_ISBN
0-8186-2822-7
Type
conf
DOI
10.1109/DAC.1992.227873
Filename
227873
Link To Document