• DocumentCode
    3259415
  • Title

    Bipartition techniques for quantitative attributes in association rule mining

  • Author

    Kang, Gong-Mi ; Moon, Yang-Sae ; Choi, Hun-Young ; Kim, Jinho

  • Author_Institution
    Dept. of Comput. Sci., Kangwon Nat. Univ., Chuncheon, South Korea
  • fYear
    2009
  • fDate
    23-26 Jan. 2009
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    In this paper we propose a systematic approach to mine quantitative association rules-association rules which contain quantitative attributes-using commercial mining tools. To achieve this goal, we first propose an overall working framework that consists of two steps: (1) a pre-processing step which converts quantitative attributes into binary attributes and (2) a post-processing step which reconverts binary association rules into quantitative association rules. We then formally redefine the previous mean-based and median-based bipartition techniques. These previous bipartition techniques, however, have the problem of not considering distribution characteristics of attribute values. To solve this problem, we propose an intuitive bipartition technique, named standard deviation minimization, which divides a quantitative attribute into two partitions to minimize their standard deviations. Through extensive experiments, we argue that our framework works correctly, and we show that our standard deviation minimization is superior to other bipartition techniques.
  • Keywords
    data mining; intuitive bipartition technique; mean-based bipartition techniques; median-based bipartition techniques; quantitative association rule mining; quantitative attributes; standard deviation minimization; systematic approach; Association rules; Computer science; Data mining; Marketing management; Medical diagnosis; Moon; Synthetic aperture sonar; Transaction databases; association rules; bipartition; data mining; quantitative association rules; quantitative attributes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    TENCON 2009 - 2009 IEEE Region 10 Conference
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-4546-2
  • Electronic_ISBN
    978-1-4244-4547-9
  • Type

    conf

  • DOI
    10.1109/TENCON.2009.5396209
  • Filename
    5396209