• DocumentCode
    3259588
  • Title

    Investigation on the dielectric properties of CaCu3Ti4+xO12+2x

  • Author

    Xu, T.W. ; Li, J.Y. ; Li, S.T.

  • Author_Institution
    State Key Lab. of Electr. Insulation & Power Equip., Xi´´an Jiaotong Univ., Xi´´an
  • fYear
    2008
  • fDate
    7-11 Sept. 2008
  • Firstpage
    211
  • Lastpage
    214
  • Abstract
    Investigation on the dielectric properties of CaCu3Ti4+xO12+2x was carried out when x was altered in the range from -0.5 to 0.5. For x= -0.5, it was found through XRD that besides primary CCTO phase, there are also CuO and CaTiO3 phases. For x= 0.5, additional TiO2 was found besides dominating CCTO phase. When x increases from -0.5 to 0.5, it was found that dielectric constant decreases, varistor voltage and non-linear coefficient increase while the dielelctric loss decreases. According to IBLC theory, it is suggested that the change of the grain boundary structure results in different barrier height and surface state when x changes.
  • Keywords
    X-ray diffraction; calcium compounds; copper compounds; dielectric losses; grain boundaries; permittivity; CaCu3Ti4+xO12+2x; XRD; dielectric constant; dielectric properties; dielelctric loss; grain boundary structure; Copper; Dielectric constant; Dielectrics and electrical insulation; Frequency; Grain boundaries; Powders; Temperature; Varistors; Voltage; X-ray scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulating Materials, 2008. (ISEIM 2008). International Symposium on
  • Conference_Location
    Mie
  • Print_ISBN
    978-4-88686-005-7
  • Electronic_ISBN
    978-4-88686-006-4
  • Type

    conf

  • DOI
    10.1109/ISEIM.2008.4664570
  • Filename
    4664570