DocumentCode
3259588
Title
Investigation on the dielectric properties of CaCu3 Ti4+x O12+2x
Author
Xu, T.W. ; Li, J.Y. ; Li, S.T.
Author_Institution
State Key Lab. of Electr. Insulation & Power Equip., Xi´´an Jiaotong Univ., Xi´´an
fYear
2008
fDate
7-11 Sept. 2008
Firstpage
211
Lastpage
214
Abstract
Investigation on the dielectric properties of CaCu3Ti4+xO12+2x was carried out when x was altered in the range from -0.5 to 0.5. For x= -0.5, it was found through XRD that besides primary CCTO phase, there are also CuO and CaTiO3 phases. For x= 0.5, additional TiO2 was found besides dominating CCTO phase. When x increases from -0.5 to 0.5, it was found that dielectric constant decreases, varistor voltage and non-linear coefficient increase while the dielelctric loss decreases. According to IBLC theory, it is suggested that the change of the grain boundary structure results in different barrier height and surface state when x changes.
Keywords
X-ray diffraction; calcium compounds; copper compounds; dielectric losses; grain boundaries; permittivity; CaCu3Ti4+xO12+2x; XRD; dielectric constant; dielectric properties; dielelctric loss; grain boundary structure; Copper; Dielectric constant; Dielectrics and electrical insulation; Frequency; Grain boundaries; Powders; Temperature; Varistors; Voltage; X-ray scattering;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulating Materials, 2008. (ISEIM 2008). International Symposium on
Conference_Location
Mie
Print_ISBN
978-4-88686-005-7
Electronic_ISBN
978-4-88686-006-4
Type
conf
DOI
10.1109/ISEIM.2008.4664570
Filename
4664570
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