• DocumentCode
    3259802
  • Title

    Efficient Output Esd Protection Of High-speed Sram Ic With Well-coupled Technique In Sub-pm Cmos Technology

  • Author

    Chau-Neng Wu ; Ming-Dou Ker ; Yu, T.-L.

  • fYear
    1997
  • fDate
    3-5 June 1997
  • Firstpage
    40
  • Lastpage
    43
  • Keywords
    CMOS integrated circuits; CMOS process; CMOS technology; Electrostatic discharge; High speed integrated circuits; MOS devices; Protection; Random access memory; Resistors; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Technology, Systems, and Applications, 1997. Proceedings of Technical Papers. 1997 International Symposium on
  • Conference_Location
    Taipei, Taiwan
  • ISSN
    1524-766X
  • Print_ISBN
    0-7803-4131-7
  • Type

    conf

  • DOI
    10.1109/VTSA.1997.614723
  • Filename
    614723