Surface analysis and application in magnetic hard disk media

Author

Gopalakrishnan, R.

Author_Institution

Inst. of Microelectron., Nat. Univ. of Singapore, Singapore

fYear

1995

fDate

27 Nov-1 Dec 1995

Firstpage

189

Lastpage

193

Abstract

Surface Techniques (XPS, AES and SIMS) are gaining popularity in recent years as an indispensable analytical tool in providing synergistic approach to solve technological problems. To illustrate the capabilities and limitations of these techniques, a wide number of practical examples in the area of magnetic disk media are presented and discussed. These examples include: measurement of loop thickness, composition of magnetic thin films, nature and quality of interface, impurity and contamination studies at micro/macroscopic regions, failure analysis etc

Keywords

Auger effect; X-ray photoelectron spectra; electron spectroscopy; hard discs; magnetic film stores; mass spectroscopic chemical analysis; photoelectron spectroscopy; secondary ion mass spectroscopy; AES; SIMS; XPS; contamination; failure analysis; impurity; interface; loop thickness; magnetic hard disk media; surface analysis; thin film composition; Charge carrier processes; Chemicals; Contamination; Electrons; Hard disks; Magnetic analysis; Magnetic films; Pollution measurement; Spectroscopy; Transistors;

fLanguage

English

Publisher

ieee

Conference_Titel

Physical and Failure Analysis of Integrated Circuits, 1995., Proceedings of the 1995 5th International Symposium on the

Print_ISBN

0-7803-2797-7

Type

conf

DOI

10.1109/IPFA.1995.487621

Filename

487621