• DocumentCode
    3260550
  • Title

    Breakdown behaviour of sub-millimetre air gaps under alternating voltage

  • Author

    Shreedevi, B.R. ; Balachandra, T.C.

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Visveshwaraya Technol. Univ., Bangalore, India
  • fYear
    2013
  • fDate
    6-8 Dec. 2013
  • Firstpage
    88
  • Lastpage
    93
  • Abstract
    Experimental results leading to breakdown voltage (BDV) measurements conducted with blade-blade, hemisphere-hemisphere and needle-plane electrode configuration in air at STP have been reported in this paper. The applied voltage was 50Hz AC, the electrode material effect on the BDV´s was studied in the needle-plane configuration by changing the plane electrode material. Electric field plots for various electrode configurations have been obtained by FEM software package. The results indicate that the overall breakdown strength of the gap in the 100 μm to 1000 μm gap range shows a marginal increase up to 400 μm and increases as we approach 100 μm irrespective of the geometry. The variations in the spread as we approach lower limit of 100 μm is attributed to the electrode configuration and/or electrode material. Further work is in progress to study the pre-breakdown behavior. The results are expected to impact MEMS technology.
  • Keywords
    air gaps; electric breakdown; electric fields; electrodes; finite element analysis; voltage measurement; BDV measurement; FEM software package; MEMS technology; STP; blade-blade electrode configuration; breakdown voltage; electric field plot; electrode material effect; hemisphere-hemisphere electrode configuration; needle-plane electrode configuration; submillimetre air gap; Blades; Electric breakdown; Electric fields; Electrodes; Finite element analysis; Materials; Needles; Breakdown strength; Electric field; Micro electrodes; Micro gaps; Micro switching; Needle-plane gaps; Submillimeter gaps;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Condition Assessment Techniques in Electrical Systems (CATCON), 2013 IEEE 1st International Conference on
  • Conference_Location
    Kolkata
  • Print_ISBN
    978-1-4799-0081-7
  • Type

    conf

  • DOI
    10.1109/CATCON.2013.6737479
  • Filename
    6737479