Localization of faulty operators on an ASIC by the use of a laser beam

Author

Bouvet, C. ; Fouillat, P. ; Dom, J.P.

Author_Institution

IXL, Bordeaux I Univ., Talence, France

fYear

1992

fDate

1-5 Jun 1992

Firstpage

412

Lastpage

413

Abstract

A powerful testing method consists in using two complementary techniques for ASIC´s failure localization and analysis: external electrical testing and internal contactless laser beam testing. This method has been made possible using the CAD environment. It provides test vectors and simulation results for the electrical external tester and ASIC layout for the internal contactless laser beam tester. The use of a laser beam integrated in automatic test equipment allows the authors to determine the logic state of any operator in the ASIC. The method is based upon the photoelectric effect generated in the laser beam-silicon interaction

Keywords

application specific integrated circuits; automatic test equipment; automatic testing; failure analysis; fault location; integrated circuit testing; integrated logic circuits; logic testing; measurement by laser beam; ASIC; CAD environment; automatic test equipment; failure localization; faulty operator localization; internal contactless testing; laser beam; logic state; photoelectric effect; test vectors; testing method; Application specific integrated circuits; Circuit faults; Circuit simulation; Circuit testing; Contacts; Costs; Integrated circuit testing; Laser beams; Laser modes; MOSFETs;

fLanguage

English

Publisher

ieee

Conference_Titel

Euro ASIC '92, Proceedings.

Conference_Location

Paris

Print_ISBN

0-8186-2845-6

Type

conf

DOI

10.1109/EUASIC.1992.227987

Filename

227987