DocumentCode :
3260612
Title :
The effect of change in DC link series resistance on the AC/AC converter operation: Power converters embedded diagnostics
Author :
Lipnicki, Piotr ; Orkisz, Michal ; Lewandowski, Daniel ; Tresch, Adrian
Author_Institution :
Corp. Res., ABB, Kraków, Poland
fYear :
2013
fDate :
6-8 Dec. 2013
Firstpage :
122
Lastpage :
127
Abstract :
Nowadays health and condition monitoring of the particular elements of the industrial system is a standard requirement. This also applies to power converters which are becoming more and more critical and important parts of the automation systems. That brings an important need for the appropriate solutions for internal diagnostics methods. One of the most important elements of the voltage source converter circuit is the DC capacitor(s). In many of the proposed and available methods the health state of the DC bus capacitor is described by monitoring the equivalent series resistance. This paper presents the method for monitoring the DC link capacitor aging effects. Additionally the article examines the possibility of using the emerging changes in the frequency spectrum of the converter currents for the DC link deterioration. The results are obtained from simulations.
Keywords :
AC-AC power convertors; capacitors; condition monitoring; electric resistance; AC-AC power converter operation; DC bus capacitor; DC link series resistance; automation system; condition monitoring; equivalent series resistance; frequency spectrum; internal diagnostics method; voltage source converter circuit; Aging; Capacitance; Capacitors; Condition monitoring; Current measurement; Harmonic analysis; Resistance; FFT; capacitor; condition monitoring; converter diagnostics; dc link; power converters;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Condition Assessment Techniques in Electrical Systems (CATCON), 2013 IEEE 1st International Conference on
Conference_Location :
Kolkata
Print_ISBN :
978-1-4799-0081-7
Type :
conf
DOI :
10.1109/CATCON.2013.6737484
Filename :
6737484
Link To Document :
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