• DocumentCode
    3260633
  • Title

    Performance of high voltage protection cards used in digital telephone exchanges

  • Author

    Reddy, B. Shilpa ; Verma, A.R. ; Palit, Sarbani ; Panda, Amrit

  • Author_Institution
    Dept. of Electr. Eng., Indian Inst. of Sci., Bangalore, India
  • fYear
    2013
  • fDate
    6-8 Dec. 2013
  • Firstpage
    128
  • Lastpage
    133
  • Abstract
    Surge voltages and currents in low ac power circuits essentially occur due to natural lightning and switching phenomena. The other source of surge occurrence is probably due to the interaction of power systems and communication system. The damages caused due to these phenomena to telecom equipment or modules create undesirable loss of service to the society. This paper presents the simulation and experimental investigations carried out on two types of high voltage high current protection cards used in digital telephone exchanges. Special efforts were made to fabricate the surge generators as per the prescribed standards. The experimental results on the performance of two types of high voltage protection (HVP) cards for combination wave (1.2/50μs open circuit voltage and 8/20μs short circuit current) and ring wave surge voltages (100kHz 0.5μs) are studied, analyzed and presented.
  • Keywords
    lightning protection; surge protection; telecommunication power supplies; telephone exchanges; combination wave; communication system; frequency 100 kHz; high voltage high current protection cards; low ac power circuits; natural lightning; power systems; ring wave surge voltages; surge currents; surge generators; surge occurrence; switching phenomena; telecom equipment; time 0.5 mus; time 1.2 mus; time 20 mus; time 50 mus; time 8 mus; Conferences; Current measurement; Generators; Integrated circuit modeling; Surge protection; Surges; Voltage measurement; combination wave; high voltage protection; lightning surges; ring wave; surge generators; telecommunication;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Condition Assessment Techniques in Electrical Systems (CATCON), 2013 IEEE 1st International Conference on
  • Conference_Location
    Kolkata
  • Print_ISBN
    978-1-4799-0081-7
  • Type

    conf

  • DOI
    10.1109/CATCON.2013.6737485
  • Filename
    6737485