DocumentCode
3260737
Title
Failure mode analysis of oil-free pulse capacitors
Author
Sharma, Ratnesh K. ; Gurav, Manohar A. ; Chavan, Satish G.
Author_Institution
Bhabha Atomic Res. Centre, Mumbai, India
fYear
2013
fDate
6-8 Dec. 2013
Firstpage
154
Lastpage
162
Abstract
The failure mode analysis is conducted for the Oil-free (dry) Can-less pulse capacitors of 6kV working voltage. Pulse capacitor stability directly influences the dependability of the pulse power system, in which, capacitor located in. This capacitor is discharged in a low inductive circuit with sub-microsecond rise time of kA current peak pulse. Oil impregnated metal can capacitor delivers high power to the load. But use of these capacitors is limited due to high self inductance, higher weight, volume and oil leakage problems. Bi-axially oriented polypropylene (BOPP) film and aluminum foil with extended foil compact design oil-free capacitor delivers moderately high power, which comes closest to fulfilling the need. This paper describes the work done at High Voltage Laboratory in the field of oil-free pulse capacitors development and the analysis carried during development and testing of these capacitors. Which helps to improve the material, design, process, testing methods etc to develop an oil-free. Failure mode of the capacitors and some of the failed capacitors photographs are also presented.
Keywords
capacitor storage; failure analysis; impregnated insulation; insulating oils; polymer films; pulsed power supplies; High Voltage Laboratory; aluminum foil; bi-axially oriented polypropylene film; failure mode analysis; foil compact design; low inductive circuit; oil impregnated metal can capacitor; oil leakage problems; oil-free dry can-less pulse capacitors; pulse capacitor stability; pulse power system; voltage 6 kV; Aluminum; Capacitors; Conferences; Inductance; Leakage currents; Resins; Pulse Capacitor; insulation failure; leakage current; resin;
fLanguage
English
Publisher
ieee
Conference_Titel
Condition Assessment Techniques in Electrical Systems (CATCON), 2013 IEEE 1st International Conference on
Conference_Location
Kolkata
Print_ISBN
978-1-4799-0081-7
Type
conf
DOI
10.1109/CATCON.2013.6737490
Filename
6737490
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