DocumentCode :
326082
Title :
A fast algorithm for calculating the reflectance of nonabsorbing multilayer dielectric films
Author :
Bataineh, M. ; Abo-Zahhad, M.
Author_Institution :
Hijjawi Fac. of Eng. Technol., Yarmouk Univ., Irbid, Jordan
Volume :
1
fYear :
1998
fDate :
21-26 June 1998
Firstpage :
174
Abstract :
In this paper, filtering nondesired bands of a polychromatic beam using multilayer dielectric films is described. The stop-bands could be placed anywhere in the spectrum range by carefully choosing the thickness and the refractive index of each layer. The total thickness of the structure, or the number of layers, affects the frequency response of the filter in such a way that increasing the number of coefficients of a digital filter or increasing the number of elements in an antenna array affects the respective responses. From computational point of view, reduction of computational time has been achieved by computing the characteristic matrix just once for similar layers. Illustrative examples are also given.
Keywords :
dielectric thin films; dielectric waveguides; frequency response; optical filters; refractive index; antenna array; characteristic matrix; computational time; digital filter; frequency response; nonabsorbing multilayer dielectric films; polychromatic beam; reflectance; refractive index; Dielectric films; Interference; Microwave filters; Nonhomogeneous media; Optical films; Optical filters; Optical waveguides; Reflectivity; Refractive index; Transmission line matrix methods;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas and Propagation Society International Symposium, 1998. IEEE
Conference_Location :
Atlanta, GA, USA
Print_ISBN :
0-7803-4478-2
Type :
conf
DOI :
10.1109/APS.1998.699102
Filename :
699102
Link To Document :
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