DocumentCode
3260953
Title
Diamond-like nanocomposite coatings possessing high dielectric strength
Author
Goel, Arvind ; Venkatraman, Chandra ; Dorfman, Benjamin F. ; Abraizov, Michael ; Engel, Thomas G. ; Loter, Nicholas G.
Author_Institution
Adv. Refractory Technol., Buffalo, NY, USA
fYear
1995
fDate
10-13 Jul 1995
Firstpage
690
Lastpage
695
Abstract
Insulator failure, due to flashover or dielectric breakdown, is the cause of decreased system reliability and component lifetime in many plasma and microwave devices. Radiation effects, including ultraviolet radiation and ion-bombardment often accelerate insulator deterioration. Replacement of plastic insulators with ceramic insulators is not practical in many cases. We have studied the feasibility of utilizing the novel diamond-like nanocomposite (DLN) thin films to protect plastic insulators and extend lifetime by enhancing dielectric properties and flashover resistance. Very high dielectric strength (107-10 8 V/cm), and high flashover resistance at various pressures have been measured. The mechanisms of breakdown are currently under investigation. Applications exist in diverse areas including power transmission, slip rings, ultracapacitors, plasma switch technology, nuclear simulators and X-ray sources (e.g., Z-pinch devices)
Keywords
carbon; electric breakdown; electric strength; flashover; insulating thin films; nanostructured materials; organic insulating materials; protective coatings; C; X-ray sources; Z-pinch devices; component lifetime; diamond-like thin films; dielectric breakdown; dielectric strength; flashover; insulator failure; ion-bombardment; nanocomposite coatings; nuclear simulators; plasma switch technology; plastic insulators; power transmission; slip rings; system reliability; ultracapacitors; ultraviolet radiation; Coatings; Dielectric breakdown; Dielectric thin films; Dielectrics and electrical insulation; Flashover; Plasma devices; Plasma measurements; Plasma simulation; Plastic insulators; Switches;
fLanguage
English
Publisher
ieee
Conference_Titel
Conduction and Breakdown in Solid Dielectrics, 1995. ICSD'95., Proceedings of the 1995 IEEE 5th International Conference on
Conference_Location
Leicester
Print_ISBN
0-7803-2040-9
Type
conf
DOI
10.1109/ICSD.1995.523075
Filename
523075
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