Title :
Functional versus random test generation for controllers and finite state machines
Author :
Karam, M. ; Saucier, G.
Author_Institution :
Inst. Nat. Polytech. de Grenoble, France
Abstract :
The authors present a functional test generation method for finite state machines based on state graph traversal and evaluates its efficiency by comparing it to random test generation and other methods on a set of benchmarks
Keywords :
finite state machines; logic testing; benchmarks; controllers; finite state machines; random test generation; state graph traversal; test generation; Automata; Benchmark testing; Fault detection; Microprocessors; Optimization methods; Performance evaluation; Phase detection; Silicon compiler; Switches; Test pattern generators;
Conference_Titel :
Euro ASIC '92, Proceedings.
Conference_Location :
Paris
Print_ISBN :
0-8186-2845-6
DOI :
10.1109/EUASIC.1992.228023
