DocumentCode
3261372
Title
New High Voltage SJ-LDMOS with Non-uniform N-buried Layer
Author
Chen, Wanjun ; Zhang, Bo ; Li, Zhaoji
Author_Institution
State key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China Chengdu, Sichuan, P. R. China, 610054, Email: cwjzcz@yahoo.com.cn
fYear
2007
fDate
3-4 June 2007
Firstpage
70
Lastpage
73
Abstract
A novel super junction LDMOS (SJ-LDMOS) structure is proposed to eliminate the substrate-assisted depletion effect. The key feature of this new structure is that a non-uniform N-buried layer is implemented between the SJ region and P substrate which provides a uniform distribution of surface electric field and ensures the heavily doped n pillars extending over the entire drift region, allowing high breakdown voltage and ultra low on-resistance. Numerical simulation results indicate that the proposed device features high breakdown voltage, low on-resistance and reduced sensitivity to doping imbalance in the pillars. In addition, the proposed device is compatible with smart power technology.
Keywords
Doping; Laboratories; MOSFET circuits; Nonuniform electric fields; Numerical simulation; Power MOSFET; Power electronics; Silicon; Thin film devices; Voltage; Electric field modulation; Lateral; Power MOSFET; Super Junction (SJ);
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices and Semiconductor Technology, 2007. EDST 2007. Proceeding of 2007 International Workshop on
Conference_Location
Tsinghua University
Print_ISBN
1-4244-1098-3
Electronic_ISBN
1-4244-1098-3
Type
conf
DOI
10.1109/EDST.2007.4289780
Filename
4289780
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