• DocumentCode
    3261372
  • Title

    New High Voltage SJ-LDMOS with Non-uniform N-buried Layer

  • Author

    Chen, Wanjun ; Zhang, Bo ; Li, Zhaoji

  • Author_Institution
    State key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China Chengdu, Sichuan, P. R. China, 610054, Email: cwjzcz@yahoo.com.cn
  • fYear
    2007
  • fDate
    3-4 June 2007
  • Firstpage
    70
  • Lastpage
    73
  • Abstract
    A novel super junction LDMOS (SJ-LDMOS) structure is proposed to eliminate the substrate-assisted depletion effect. The key feature of this new structure is that a non-uniform N-buried layer is implemented between the SJ region and P substrate which provides a uniform distribution of surface electric field and ensures the heavily doped n pillars extending over the entire drift region, allowing high breakdown voltage and ultra low on-resistance. Numerical simulation results indicate that the proposed device features high breakdown voltage, low on-resistance and reduced sensitivity to doping imbalance in the pillars. In addition, the proposed device is compatible with smart power technology.
  • Keywords
    Doping; Laboratories; MOSFET circuits; Nonuniform electric fields; Numerical simulation; Power MOSFET; Power electronics; Silicon; Thin film devices; Voltage; Electric field modulation; Lateral; Power MOSFET; Super Junction (SJ);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices and Semiconductor Technology, 2007. EDST 2007. Proceeding of 2007 International Workshop on
  • Conference_Location
    Tsinghua University
  • Print_ISBN
    1-4244-1098-3
  • Electronic_ISBN
    1-4244-1098-3
  • Type

    conf

  • DOI
    10.1109/EDST.2007.4289780
  • Filename
    4289780