DocumentCode
326143
Title
Treating late-time instability of partially tetrahedral-gridded finite difference time domain method
Author
Chieh-Tsao Hwang ; Ruey-Beei Wu
Author_Institution
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Volume
1
fYear
1998
fDate
21-26 June 1998
Firstpage
562
Abstract
A partially tetrahedral-gridded FDTD method has been proposed to solve the time-domain electromagnetic scattering of two or three-dimensional arbitrarily shaped dielectric objects. It successfully employs the conventional FDTD method for most of the regular region but introduces the tetrahedral edge-based finite element scheme to model the region near the arbitrarily curved surfaces. Numerical results of early time simulation validate that the method has the advantages of accuracy, flexibility, stability, and computational efficiency. For the analyses of electromagnetic problems of high Q systems, transient response over a very long duration is necessary. It is found that the simulation may suffer from late-time instability and spurious DC modes. This paper is focused on treating the two drawbacks of the hybrid method.
Keywords
Q-factor; dielectric resonators; electromagnetic wave scattering; finite difference time-domain analysis; microstrip lines; numerical stability; transient response; accuracy; computational efficiency; curved surfaces; dielectric objects; dielectric resonators; early time simulation; electromagnetic problems; finite difference time domain method; high Q systems; hybrid method; late-time instability; microstrip line; partially tetrahedral-gridded FDTD; simulation; spurious DC modes; stability; temporal filtering; tetrahedral edge-based finite element; time-domain electromagnetic scattering; transient response; Computational efficiency; Computational modeling; Dielectrics; Electromagnetic analysis; Electromagnetic scattering; Finite difference methods; Finite element methods; Stability; Time domain analysis; Transient response;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium, 1998. IEEE
Conference_Location
Atlanta, GA, USA
Print_ISBN
0-7803-4478-2
Type
conf
DOI
10.1109/APS.1998.699202
Filename
699202
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