• DocumentCode
    3261482
  • Title

    Differential evolutionary Bayesian classifier

  • Author

    Deng, Wanyu ; Zheng, Qinghua ; Wang, Yulan ; Chen, Lin ; Xu, Xuebin

  • Author_Institution
    MOE KLINNS Lab., Xian Jiaotong Univ., Xian
  • fYear
    2008
  • fDate
    26-28 Aug. 2008
  • Firstpage
    191
  • Lastpage
    195
  • Abstract
    Naive Bayes (NB) based on the attribute independence assumption has been widely applied in many domains for its simplicity and efficiency. However, the independence assumption is often violated in many real-world applications. In response to this problem, a mount of research has been carried out to improve NBpsilas accuracy by mitigating the attribute independence assumption, for example Lazy learning of Bayesian Rules(LBR), Tree Augmented Naive Bayes (TAN) and Averaged One-Dependence Estimator(AODE). AODE which averages all Super Parent One-dependence Estimators (SPODE) has attracted widely attention for its outstanding performance. Because of the different role of every SPODEs, the performance will be expected to be improved significantly if different weights are assigned to these SPODEs. We proposed the framework of linear weighted SPODE ensemble and efficient learning strategy of weights based on differential evolution. The experience has shown that the proposed algorithm can generate better performance in most case than NB, AODE, WAODE, TAN and LBR.
  • Keywords
    Bayes methods; estimation theory; evolutionary computation; learning (artificial intelligence); pattern classification; attribute independence; differential evolutionary Bayesian classifier; learning strategy; linear weighted super parent one-dependence estimator; Accuracy; Aggregates; Bayesian methods; Computer science; Frequency estimation; Mutual information; Niobium; Search methods; Stability; Telecommunications; AODE; Classifier; Differential Evolutionary; Generic Algorithm; Naïve Bayes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Granular Computing, 2008. GrC 2008. IEEE International Conference on
  • Conference_Location
    Hangzhou
  • Print_ISBN
    978-1-4244-2512-9
  • Electronic_ISBN
    978-1-4244-2513-6
  • Type

    conf

  • DOI
    10.1109/GRC.2008.4664679
  • Filename
    4664679