Title :
Adaptive admittance-based conductor meshing for interconnect analysis
Author :
Yang, Ya-Chi ; Koh, Cheng-Kok ; Balakrishnan, Venkataramanan
Author_Institution :
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN
Abstract :
We present a new algorithm for discretizing interconnects, a step that is typically performed to account for the nonuniformity of current flow at high frequencies. The algorithm is based on an easily-computable measure that correlates well with the model accuracy. This measure is used to refine the discretization of interconnects in an adaptive scheme so as to systematically trade off computation against model accuracy. We apply the proposed discretization technique on two classes of problems in the analysis of VLSI interconnects: simulation and frequency-dependent inductance extraction. Numerical results establish that with the interconnect discretizations generated by our algorithm, a reduction in simulation and extraction times by a factor between three and seven can be realized with negligible sacrifice in model accuracy (<1% error)
Keywords :
VLSI; integrated circuit interconnections; VLSI interconnect; adaptive admittance-based conductor meshing; current flow nonuniformity; frequency-dependent inductance extraction; interconnect analysis; interconnect discretization; Analytical models; Computational modeling; Conductors; Frequency; High performance computing; Inductance; Integrated circuit interconnections; Proximity effect; Skin; Very large scale integration;
Conference_Titel :
Design Automation, 2006. Asia and South Pacific Conference on
Conference_Location :
Yokohama
Print_ISBN :
0-7803-9451-8
DOI :
10.1109/ASPDAC.2006.1594736