Design of an image processing integrated circuit for real time edge detection

Author

Robert, M. ; Bonnaure, JP. ; Paindavoine, Marie ; Hafdi, S.

Author_Institution

Montpellier II Univ., Inst. des Sci. de l´´Ingenieur, France

fYear

1992

fDate

1-5 Jun 1992

Firstpage

280

Lastpage

283

Abstract

Presents the design of a real time image processing micro-system to detect defects on manufacturing products. The analysis method is based on an edge detection algorithm (differential operators) to select the information related to the structure of the objects present in the image. The edge calculation function has been integrated in a standard cell circuit using a CMOS 1.5 μm process. The ASIC has been implemented and tested in an image processing microsystem with a CCD camera. Results show an improvement of performances (speed, noise, size reduction system characterization, etc. . .) in comparison with the first prototypes (software implementation and printed board with standard components) allowing the use of this system in an industrial environment for the real time detection of defects

Keywords

CMOS integrated circuits; application specific integrated circuits; automatic optical inspection; computer vision; edge detection; image processing equipment; microprocessor chips; quality control; real-time systems; 1.5 micron; ASIC; CCD camera; CMOS; circuit layout; defect detection; detection of defects; differential operators; edge detection algorithm; image processing integrated circuit; image processing micro-system; improvement of performances; industrial environment; manufacturing; noise; optical inspection; real time edge detection; size reduction; speed; standard cell circuit; system characterization; Algorithm design and analysis; Application specific integrated circuits; CMOS process; Charge coupled devices; Circuit testing; Image analysis; Image edge detection; Image processing; Information analysis; Manufacturing processes;

fLanguage

English

Publisher

ieee

Conference_Titel

Euro ASIC '92, Proceedings.

Conference_Location

Paris

Print_ISBN

0-8186-2845-6

Type

conf

DOI

10.1109/EUASIC.1992.228040

Filename

228040