• DocumentCode
    3261857
  • Title

    Impact of ECCs on simultaneously switching output noise for on-chip busses of high reliability systems [error correcting codes]

  • Author

    Rossi, D. ; Muccio, A. ; Nieuwland, A.K. ; Katoch, A. ; Metra, C.

  • Author_Institution
    DEIS, Bologna Univ., Italy
  • fYear
    2004
  • fDate
    12-14 July 2004
  • Firstpage
    135
  • Lastpage
    140
  • Abstract
    In this paper, we analyze the impact of error correcting codes (ECCs) on simultaneously switching outputs (SSO) noise, for the case of a realistic bus of a high reliability system. First, we analyze the effect of different bus transitions on SSO noise. Then we show how different ECCs, requiring a different number of check bits, impact the SSO noise. We prove that Hamming codes cause less noise than the ECCs that have been proposed so far to reduce power consumption and crosstalk-induced delay. In particular, we show that the code requirements for crosstalk and power minimization in terms of switching activity of adjacent wires are opposite to those for SSO noise reduction. Our analysis has been performed considering realistic bus and power supply network models, both implemented using a standard 0.25 μm CMOS technology.
  • Keywords
    Hamming codes; crosstalk; electromagnetic interference; error correction codes; integrated circuit modelling; integrated circuit noise; integrated circuit reliability; system buses; 0.25 micron; CMOS technology; ECC check bit numbers; EMI; Hamming codes; SSO noise reduction; adjacent wire switching activity; bus transitions; crosstalk-induced delay; dual-rail code; error correcting codes; high reliability systems; on-chip busses; power consumption reduction; simultaneously switching output noise; CMOS technology; Crosstalk; Delay; Energy consumption; Error correction codes; Noise reduction; Performance analysis; Power system reliability; System-on-a-chip; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    On-Line Testing Symposium, 2004. IOLTS 2004. Proceedings. 10th IEEE International
  • Print_ISBN
    0-7695-2180-0
  • Type

    conf

  • DOI
    10.1109/OLT.2004.1319671
  • Filename
    1319671