Title :
Hardware reconfiguration scheme for high availability systems
Author :
Metra, C. ; Ferrari, A. ; Omaña, M. ; Pagni, A.
Author_Institution :
DEIS, Bologna Univ., Italy
Abstract :
We propose a hardware reconfiguration scheme that, together with the adoption of an on-line testing strategy, can be employed to meet the goal of designing highly available systems to be implemented by means of very deep sub-micron technology. Compared to alternate software reconfiguration schemes frequently employed for high reliability systems, that proposed here allows us to minimize the reconfiguration impact on system performance, thus being suitable for applications with strong constraints in terms of performance and availability. Our scheme features a self-checking ability with respect to its possible internal faults, thus guaranteeing that no erroneous reconfiguration can occur, because of faults affecting the reconfiguration hardware itself.
Keywords :
automatic testing; fault tolerance; integrated circuit reliability; logic design; logic testing; reconfigurable architectures; availability constraints; fault tolerance; hardware reconfiguration; hardware reconfiguration scheme; high availability systems; internal fault self-checking; on-line testing; on-line testing architecture; performance constraints; reconfiguration impact minimization; self-checking automata systems; very deep sub-micron technology; Availability; Circuit faults; Costs; Crosstalk; Hardware; Power supplies; Power system reliability; Software performance; System testing; Voltage;
Conference_Titel :
On-Line Testing Symposium, 2004. IOLTS 2004. Proceedings. 10th IEEE International
Print_ISBN :
0-7695-2180-0
DOI :
10.1109/OLT.2004.1319675