DocumentCode :
3262143
Title :
Survey of the algorithms in the column-matching BIST method
Author :
Fiser, Petr ; Kubatova, Hana
Author_Institution :
Dept. of Comput. Sci. & Eng., Czech Tech. Univ., Prague, Czech Republic
fYear :
2004
fDate :
12-14 July 2004
Firstpage :
181
Abstract :
We propose a discussion on possible heuristic algorithms solving the major part of our BIST synthesis method - the column matching. The main part of our BIST design is an output decoder transforming pseudo-random LFSR code words into deterministic tests pre-computed by an ATPG tool. Synthesis of this decoder is based on coupling as many of its outputs with the inputs as possible, which significantly reduces its complexity. This NP-hard problem has to be solved by some heuristic algorithm.
Keywords :
automatic test pattern generation; built-in self test; decoding; heuristic programming; logic design; logic testing; random sequences; ATPG tool; BIST heuristic algorithms; NP-hard problem; code transformation; column-matching BIST method; deterministic tests; input/output coupling; output decoder; pseudo-random LFSR code words; Built-in self-test; Circuit faults; Circuit testing; Computer science; Decoding; Electrical fault detection; Fault detection; Heuristic algorithms; Phase detection; Switches;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
On-Line Testing Symposium, 2004. IOLTS 2004. Proceedings. 10th IEEE International
Print_ISBN :
0-7695-2180-0
Type :
conf
DOI :
10.1109/OLT.2004.1319683
Filename :
1319683
Link To Document :
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