DocumentCode :
3262215
Title :
A probabilistic analysis of pipelined global interconnect under process variations
Author :
Kankani, Navneeth ; Agarwal, Vineet ; Wang, Janet
Author_Institution :
Dept. of Electr. & Comput. Eng., Arizona Univ., Tucson, AZ
fYear :
2006
fDate :
24-27 Jan. 2006
Abstract :
The main thesis of this paper is to perform a reliability based performance analysis for a shared latch inserted global interconnect under uncertainty. We first put forward a novel delay metric named DMA for estimation of interconnect delay probability density function considering process variations. Without considerable loss in accuracy, DMA can achieve high computational efficiency even in a large space of random variables. We then propose a comprehensive probabilistic methodology for sampling transfers, on a shared latch inserted global interconnect, that highly improves the reliability of the interconnect. Improvements up to 125% are observed in the reliability when compared to deterministic sampling approach. It is also shown that dual phase clocking scheme for pipelined global interconnect is able to meet more stringent timing constraints due to its lower latency
Keywords :
integrated circuit interconnections; integrated circuit reliability; probability; sampling methods; DMA; delay metric; deterministic sampling approach; dual phase clocking scheme; interconnect delay; performance analysis; pipelined global interconnect; probabilistic analysis; probability density function; process variations; Bit error rate; Clocks; Delay estimation; Frequency; Performance analysis; Pipeline processing; Probability density function; Sampling methods; Timing; Uncertainty;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation, 2006. Asia and South Pacific Conference on
Conference_Location :
Yokohama
Print_ISBN :
0-7803-9451-8
Type :
conf
DOI :
10.1109/ASPDAC.2006.1594772
Filename :
1594772
Link To Document :
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