DocumentCode :
3262620
Title :
An SPU reference model for simulation, random test generation and verification
Author :
Watanabe, Yukio ; Sallay, Balazs ; Michael, Brad ; Brokenshire, Daniel ; Meil, Gavin ; Shafi, Hazim ; Hiraoka, Daisuke
Author_Institution :
Semicond. Co., Toshiba Corp., Kawasaki, Japan
fYear :
2006
fDate :
24-27 Jan. 2006
Abstract :
An instruction set level reference model was developed for the development of synergistic processing unit (SPU), which is one of the key components of the cell processor [Pham, 2005][Flachs, 2005]. This reference model was used for the simulators to define the instruction set architecture (ISA), for the random test case generator, for the reference in the verification environment and for the software development. Using the same reference model for multiple purposes made it easier to keep up with the architecture changes at the early stage of the microprocessor development. Also including the reference model in the simulation environment increased the robustness for the random test executions and made it possible to find bugs that are usually difficult to catch.
Keywords :
C++ language; formal verification; instruction sets; microprocessor chips; SPU reference model; cell processor; instruction set architecture; instruction set level reference model; random test case generator; random test generation; software development; synergistic processing unit; Computer architecture; Computer bugs; Decoding; Instruction sets; Microprocessors; Programming; Registers; Robustness; Software testing; Streaming media;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation, 2006. Asia and South Pacific Conference on
Print_ISBN :
0-7803-9451-8
Type :
conf
DOI :
10.1109/ASPDAC.2006.1594794
Filename :
1594794
Link To Document :
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