Statistical leakage minimization through joint selection of gate sizes, gate lengths and threshold voltage

This paper proposes a novel methodology for statistical leakage minimization of digital circuits. A function of mean and variance of the circuit leakage is minimized with constraint on a-percentile of the delay using physical delay models. Since the leakage is a strong function of the threshold voltage and gate length, considering them as design variables can provide significant amount of power savings. The leakage minimization problem is formulated as a multivariable convex optimization problem. We demonstrate that statistical optimization can lead to more than 37% savings in nominal leakage compared to worst-case techniques that perform only gate sizing