• DocumentCode
    3263958
  • Title

    High Performance Gate-all-around TFT(GAT) For High-density, Low-voltage-operation, And Low-power Srams

  • Author

    Miyamoto, S. ; Maegawa, S. ; Maeda, S. ; Ipposhi, T. ; Kuriyama, H. ; Nishimura, T.

  • fYear
    1997
  • fDate
    3-5 June 1997
  • Firstpage
    128
  • Lastpage
    132
  • Keywords
    Electric variables; Energy consumption; Fabrication; Grain boundaries; Laboratories; Low voltage; Performance analysis; Thin film transistors; Threshold voltage; Ultra large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Technology, Systems, and Applications, 1997. Proceedings of Technical Papers. 1997 International Symposium on
  • Conference_Location
    Taipei, Taiwan
  • ISSN
    1524-766X
  • Print_ISBN
    0-7803-4131-7
  • Type

    conf

  • DOI
    10.1109/VTSA.1997.614743
  • Filename
    614743
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3263958