• DocumentCode
    326435
  • Title

    Computation of transient scattering from electrically large structures using the plane wave time domain algorithm

  • Author

    Shanker, B. ; Ergin, A.A. ; Ayglin, K. ; Michielssen, E.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
  • Volume
    2
  • fYear
    1998
  • fDate
    21-26 June 1998
  • Firstpage
    948
  • Abstract
    Reducing the computational complexity of time domain integral equation (TDIE) schemes would yield a viable approach for analyzing transient scattering from electrically large structures. This paper illustrates the application of the plane wave time domain (PWTD) algorithm to the analysis of transient electromagnetic scattering from electrically large perfect conducting surface scatterers residing in free space. These algorithms complement classical marching-on-in-time (MOT) schemes for solving electric and magnetic field integral equations (EFIE, MFIE). Also, computational results illustrating the usefulness of these algorithms in analyzing transient scattering from electrically large structures are presented.
  • Keywords
    backscatter; computational complexity; electric field integral equations; electromagnetic wave scattering; magnetic field integral equations; time-domain analysis; transient analysis; PWTD algorithm; back scattered field; computational complexity reduction; electric field integral equation; electrically large structures; free space; magnetic field integral equation; marching-on-in-time; perfect conducting surface scatterers; plane wave time domain algorithm; time domain integral equation; transient scattering; Algorithm design and analysis; Computational complexity; Electromagnetic analysis; Electromagnetic scattering; Electromagnetic transients; Integral equations; Magnetic analysis; Surface waves; Time domain analysis; Transient analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 1998. IEEE
  • Conference_Location
    Atlanta, GA, USA
  • Print_ISBN
    0-7803-4478-2
  • Type

    conf

  • DOI
    10.1109/APS.1998.702106
  • Filename
    702106