Title :
Laser degradation, important understandings for product manufacturing
Author_Institution :
Bell Labs., Lucent Technol., Murray Hill, NJ, USA
Abstract :
Degradation of laser diodes during normal operation or under accelerated aging testing occurs at the weak links of the device structures. By identifying these weak links and understanding their degradation mechanisms, the material structure as well as the device design can be improved
Keywords :
laser reliability; life testing; semiconductor device manufacture; semiconductor lasers; accelerated aging testing; degradation mechanisms; device design; laser degradation; laser diodes; material structure; normal operation; product manufacturing; weak links; Accelerated aging; Degradation; Diode lasers; Electrostatic discharge; Manufacturing; Paper technology; Semiconductor device manufacture; Semiconductor lasers; Stress; Temperature;
Conference_Titel :
Lasers and Electro-Optics Society Annual Meeting, 1997. LEOS '97 10th Annual Meeting. Conference Proceedings., IEEE
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-3895-2
DOI :
10.1109/LEOS.1997.645278
