DocumentCode :
3264823
Title :
Fault current increase due to the progressive undergrounding of a HV subtransmission network
Author :
Schembari, M. ; Codino, A. ; Catapano, A. ; Lauria, S.
Author_Institution :
Dept. of Astronaut., Electr. & Energetics Eng., “Sapienza” Univ. of Rome, Rome, Italy
fYear :
2015
fDate :
10-13 June 2015
Firstpage :
1403
Lastpage :
1408
Abstract :
The undergrounding of HV subtransmission networks in urban/suburban areas is bound to increase fault currents, especially for ground faults if system neutral is solidly grounded. A parametric fault analysis based on symmetrical components is applied to a sample HV system with three lines and two EHV points of supply, based on a simple meshed Italian subtransmission network. Results are then validated by detailed three-phase ATP-EMTP simulations. Values yielded by the parametric study confirm the expected increase of all fault levels, reaching up to 36% and 69% for three-phase and 1-phase-to-ground faults, and even 104% for the ground current of phase-to-phase-to-ground faults. All calculated values are however tolerable, with fault currents well within the operating envelope of devices and components; cross-bonded sheaths also significantly relieve substation grounding mats. Some consequences of undergrounding such as reduction of earth-fault factor may be actually beneficial.
Keywords :
fault currents; power transmission faults; substations; underground transmission systems; HV subtransmission network; cross-bonded sheaths; fault current; parametric fault analysis; phase-to-phase-to-ground faults; progressive undergrounding; simple meshed Italian subtransmission network; substation grounding mats; three-phase ATP-EMTP simulations; urban-suburban areas; Cable shielding; Circuit faults; Fault currents; Grounding; Integrated circuit modeling; Power cables; Substations; HV subtransmission networks; fault currents; primary station grounding system; underground cables;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Environment and Electrical Engineering (EEEIC), 2015 IEEE 15th International Conference on
Conference_Location :
Rome
Print_ISBN :
978-1-4799-7992-9
Type :
conf
DOI :
10.1109/EEEIC.2015.7165375
Filename :
7165375
Link To Document :
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